|
序号 |
索取号 |
正题名 |
责任者 |
出版者 |
出版日期 |
|
1
|
TN304.2/C111
|
Characterization in compound semiconduct
|
C. Richard Brundle, Charles A. Evans, Jr
|
哈尔滨工业大学出版社
|
2014.01
|
|
2
|
TN305/C111
|
Characterization in silicon processing
|
C. Richard Brundle, Charles A. Evans, Jr
|
哈尔滨工业大学出版社
|
2014.01
|
|
3
|
TB34/C111
|
Characterization of optical materials
|
C. Richard Brundle, Charles A. Evans, Jr
|
哈尔滨工业大学出版社
|
2014.01
|
|
4
|
TB43/C111
|
Characterization of organic thin films
|
C. Richard Brundle, Charles A. Evans, Jr
|
哈尔滨工业大学出版社
|
2014.01
|
|
5
|
TB39/C111
|
Characterization of tribological materia
|
C. Richard Brundle, Charles A. Evans, Jr
|
哈尔滨工业大学出版社
|
2014.01
|