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超大规模集成电路测试：数字、存储器和混合信号系统= Essentials of electronic testing for digital：Memory & mixed-signal VLSI circuits/(美) Michael L. Bushnell, Vishwani D. Agrawal著/蒋安平, 冯建华, 王新安译.-北京：电子工业出版社，2005.08
